VNA Active Device Characterization Essentials Webinar Series

Accurately characterizing active and passive devices like filters, duplexers, amplifiers, and frequency converters is essential to developing the highest-quality components. Unfortunately, the real-world performance of these components is often determined in part by the performance of the measurement tools used for that characterization. With the evolving of modern network analyzer with integrated signal analyzer and high performance signal generators, learn how to use the network analyzer’s new capabilities for your daily components characterisations in the VNA characterisation series Webinars.

Select one or more webinars of interest, then submit registration form.

VNA Active Device Characterization Essentials: Accurate Wideband Demodulation

Available On-Demand

Error vector magnitude (EVM) is considered a comprehensive transmitter performance benchmark, prompting component and subsystem manufacturers to provide explicit product EVM metrics. However, traditional single-ended symbol EVM measurements are incapable of distinguishing component distortions from that of the source, receiver, or any other test fixtures. Furthermore, traditional signal analyzers suffer from signal to noise ratio (SNR) degradation as the analysis bandwidth (BW) increases. By using a vector network analyzer (VNA) to capture symbol EVM instead, accurate delineation of DUT EVM is available with all source distortion effects removed and excellent SNR regardless of the analysis BW.

In part 2 of the VNA Active Device Characterization Essentials webinar series, you will learn how to make symbol EVM measurements using a VNA with Modulation Distortion and PathWave Vector Signal Analysis software to solely capture an amplifier’s distortion characteristics.

Modulation Distortion with Load Pull

Available On-Demand

Power amplifier designers need accurate device models to minimize design cycle. Key performance metrics to measure include error vector magnitude (EVM), adjacent-channel leakage ratio (ACLR), output power, and gain. Characterizing transistor behaviour with modulated stimulus under varying load conditions allows for more accurate device models, shortening time to market.

In part 1 of this webinar series, VNA Active Device Characterization Essentials, you will learn how to perform calibrated EVM measurements using a vector network analyzer with a modulation-distortion application and a vector signal generator. Our evolved approach allows for integrated control of a tuner to perform modulated transistor characterization under load pull conditions

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