Tackling mmWave Signal Analysis Challenges

Millimeter-wave technology is a key enabler and provides ample margin for performance improvement, but it creates challenges such as path loss, tight design margins, complex modulation, and stringent standards.

This webinar will discuss the key considerations when tackling the test challenges for today’s and tomorrow’s millimeter-wave applications.

In this webinar you will learn about:

Wireless industry trends
3 key components (Pathloss, wideband noise & frequency response) affecting your EVM measurement quality
Optimizing the measurements with the right setting and new improved accessories

Date: Thursday Nov 18, 2021

Time: 10:00 AM SGT (GMT +8)

Duration: 1 hour

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PRESENTERS

Paris Akhshi

Product Marketing Manager

Keysight Technologies