Faster, Cleaner, and Phase Noise too.

Overview

Title: 10x Faster, 30x Cleaner, and Phase Noise Too? New PNA-X DDS Enhancements

On-Demand Available

Duration: 1 hour

Summary

Keysight’s new DDS source (available since Sept 2020) makes phase and group delay measurements 10 times faster with 30 times less noise in the trace. Further, the DDS has virtually no spurs and very low phase noise, meaning it is easier to see close-in spurious caused by an internal LO to the frequency converter.This first in a series of webinars on mixer and converter test introduces recent enhancements which have greatly improved the ability of the PNA and PNA-X to characterize frequency converters and mixers.

In this webinar series we show:

New phase-noise measurement application, utilizing the new DDS synthesizer as an LO, allows one to directly measure the phase noise of a frequency converter with an embedded LO
New DDS system provides an optional 3rd source (up to 13.5 GHz) that can be used to drive an LO of a mixer while 2 tones (combined internally from ports 1 and 3) can be applied to measure IMD
Modulation/Distortion (Mod/Dist) application with measurements on frequency converters
New method of source Digital Pre-Distortion that allows us to create wideband signals (up to 4 GHz or more), with nearly perfect EVM even when driven at high powers.

This introductory webinar will be followed by short, single-purpose webinars covering individual key measurements and the set up needed to optimize mixer measurements on PNA-X.

Speakers

Joel Nelson

R&D Fellow

Keysight Technologies

Since graduating from Oregon State University with an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies (formerly Agilent and Hewlett-Packard) at the Santa Rosa Site. He received his Ph.D. from Leeds University in 2004. He is a Keysight R&D Fellow focused on component test. He was a principle contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and Microwave circuit designs in these products. Recently, he has worked in non-linear test including differential devices, and mixer measurements, as well as modulated and spectrum measurements. He has received 26 patents related to this work and authored the “Handbook of Microwave Component Measurements”. He co-taught an RF course at the University of California, Berkeley, and presented several short courses and seminars through ARFTG, MTT and Keysight.

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