Performing current vs. voltage characterization on devices and materials at very low current levels presents a unique set of measurement challenges. Normal measurement issues such as noise, transient signals and cabling and fixturing parasitics are much harder to solve when dealing with currents in the femtoamp range. In addition, many cutting-edge materials have extremely high resistances that conventional DMMs and source/measurement units (SMUs) cannot measure.  In this seminar Keysight will explain the measurement techniques, tricks and tools necessary to measure currents down to 0.01 femtoamps and resistances up to 10 Peta Ohms with both high measurement confidence and repeatability.