Get the True Performance of Your DUT Using ccEVM Measurement
Get the TRUE performance of your DUT using ccEVM measurement
A new technique revealed to improve your EVM measurement by up to 5 dB
Measuring the true performance of your device under test (DUT) in wireless and cellular industries requires a test system that can suppress the system noise to get a lower error vector magnitude (EVM) floor, even at higher frequencies and wider bandwidths. 

Join Keysight experts in this webinar to learn how our cross-correlated EVM (ccEVM) technique can provide you with the ideal solution for the lowest EVM measurement so you can get the true performance of your DUT. 
Date: Wednesday July 19, 2023
Time: 10:00 AM PT
Duration: 1 hour

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Guo-Quan Lu
R&D Engineer
Keysight Technologies
Parisa Akhshi
Product Marketing Manager
Keysight Technologies

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