Modulation Distortion with Load Pull Webinar
RF Microwave
VNA Active Device Characterization Essentials Series
Power amplifier designers need accurate device models to minimize design cycle. Key performance metrics to measure include error vector magnitude (EVM), adjacent-channel leakage ratio (ACLR), output power, and gain. Characterizing transistor behavior with modulated stimulus under varying load conditions allows for more accurate device models, shortening time to market. 

In part 1 of this webinar series, VNA Active Device Characterization Essentials, you will learn how to perform calibrated EVM measurements using a vector network analyzer with a modulation-distortion application and a vector signal generator. Our evolved approach allows for integrated control of a tuner to perform modulated transistor characterization under load pull conditions.

Original Webinar Date: March 15, 2022
Time: On-demand
Duration: 1 hour

By clicking “Submit” you are providing Keysight with your personal data.

For information on how we use this data, see the Keysight Privacy Statement link at the bottom of this page.

Nizar Messaoudi - Keysight
Vincent Malette - Focus Microwave
Gabrielle Duncan - Keysight
Nizar Messaoudi
PNA Product Manager
Keysight Technologies
Vincent Mallette
Executive VP
Focus Microwave
Gabrielle Duncan
Product Marketing Manager
Keysight Technologies

Learn more about our commitment to privacy:  Keysight Privacy Statement
©   Keysight Technologies