Field Effect Transistors (FET) Measurements with Bench SMUs

When testing Field Effect Transistors (FETs), are you struggling to evaluate lower current, or struggling with making complex analyses?

As integrated circuits and electronic devices evolve, the requirements for FETs are becoming increasingly demanding, especially those that require very low currents.

Join this webinar as we share, with several demos and examples, how a precision Benchtop Source/Measure Unit can be used to easily and accurately make measurements such as:

Id- Vgs
Id – Vds
Low leakage current
Vth measurement
On resistance

This will be an interactive webinar with a live Q&A session at the end - we look forward to you joining us.

Available On Demand

Duration: 1 hour

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PRESENTER

Hu-Yen, Chai

Channel Development Manager

Keysight Technologies