Get the TRUE Performance of Your DUT Using ccEVM Measurement
Measuring the true performance of your device under test (DUT) in wireless and cellular industries requires a test system that can suppress the system noise to get a lower error vector magnitude (EVM) floor, even at higher frequencies and wider bandwidths.
Join Keysight experts in this webinar to learn how our cross-correlated EVM (ccEVM) technique can provide you with the ideal solution for the lowest EVM measurement so you can get the true performance of your DUT.