Parametric Photonic Test
High-Volume Pic Test
New polarization alignment and stabilized polarization sweeps are especially valuable for on-wafer and PIC testing, including probe alignment. Learn about Keysight’s turnkey solution for polarization optimization based on the Mueller Matrix technique to greatly reduce measurement and start-up times. We will demonstrate how to make insertion loss (IL), polarization-dependent loss (PDL), transverse electric(TE)/transverse magnetic (TM), and responsivity measurements in a single sweep without polarization alignment.
Solution Capabilities:
- Fast single-sweep PDL
- TE/TM and pol-alignment
- Scalable: λ-bands, ports
Application Note
Technical Overview
Interested? Request more information!
For seminars, remote demos, individual meeting requests, and other inquiries, please feel free to contact us by clicking the button below.
Keysight's Products
Helping Accelerate Your Innovations
Learn more about our commitment to privacy: Keysight Privacy Statement
© Keysight Technologies
© Keysight Technologies