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Wafer Level Test

In this demo, we will show an efficient optical and electro-optical wafer and die-level testing solution with surface and edge coupling. Keysight’s integrated photonic test solution integrates with FormFactors’ CM300xi probe station through PathWave Test Automation plugins. Additional Keysight products included are KS8400A TAP and plugins, N7700C Photonic Application Suite, N4372E Lightwave component analyzer (LCA), 81606C tunable laser source (TLS), N7745C multiport power meter, N7786C polarization synthesizer, and the new M9601A PXIe source measure unit.

Solution Capabilities:
  • 110 GHz O/E and E/O test
  • Complete optical and RF test
  • Fully integrated and automated
Wafer test
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