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3D Sensing Devices Testing:
Overcoming Top 5 LIV Test Challenges
3D Sensing Devices Testing: Overcoming Top 5 LIV Test Challenges
Available on-demand

The adoption of 3D sensing technology in smartphones and automotive applications has brought to the forefront the need to effectively measure Vertical-Cavity Surface-Emitting Lasers (VCSEL) - a key component in this booming technology.

VCSEL measurements need to be made at various stages, from device development and wafer fabrication to packaged device and module. A key test involved is LIV (light-current-voltage) testing.

Join this webinar as we share on:

  • Key tests in characterising VCSEL
  • Top 5 LIV test challenges and how to overcome them
  • Types of PXIe solutions available and why to consider them
Dr. Ervin Mile
Dr. Ervin Mile
Business Development Manager
Keysight Technologies
Dr. Ervin Mile is currently the Americas and Europe Power Specialist and has been with Keysight Technologies for 10 years. He has a broad knowledge of various industrial and R&D sectors ranging from Material Science, Semiconductors, Nanotechnology, Electrochemistry and Physics. He holds a B.Eng. in EE from “Politecnico di Torino”, M.Sc. in micro and nanotechnologies for integrated circuits from “Ecole Polytechnique Lausanne”, and a PhD in Physics of micro and nanoelectro-mechanical systems from “Ecole Polytechnique Paris”.

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